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[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - Functional Fmax test-time reduction using novel DFTs for circuit initialization
Guin, Ujjwal, Chakraborty, Tapan, Tehranipoor, MohammadYear:
2013
Language:
english
DOI:
10.1109/iccd.2013.6657017
File:
PDF, 288 KB
english, 2013