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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Impact of the application activity on intermittent faults in embedded systems
Guilhemsang, Julien, Heron, Olivier, Ventroux, Nicolas, Goncalves, Olivier, Giulieri, AlainYear:
2011
Language:
english
DOI:
10.1109/vts.2011.5783782
File:
PDF, 5.83 MB
english, 2011