[IEEE AFRICON 2009 (AFRICON) - Nairobi, Kenya (2009.09.23-2009.09.25)] AFRICON 2009 - Low-frequency noise measurement of a highly stable charge-meter
Nihtianov, Stoyan, Guo, XiaodongYear:
2009
Language:
english
DOI:
10.1109/afrcon.2009.5308334
File:
PDF, 13.94 MB
english, 2009