[IEEE AFRICON 2009 (AFRICON) - Nairobi, Kenya...

  • Main
  • [IEEE AFRICON 2009 (AFRICON) - Nairobi,...

[IEEE AFRICON 2009 (AFRICON) - Nairobi, Kenya (2009.09.23-2009.09.25)] AFRICON 2009 - Low-frequency noise measurement of a highly stable charge-meter

Nihtianov, Stoyan, Guo, Xiaodong
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/afrcon.2009.5308334
File:
PDF, 13.94 MB
english, 2009
Conversion to is in progress
Conversion to is failed