Efficient sampling for computer vision roundness inspection

Efficient sampling for computer vision roundness inspection

Chen, Chie-Bein, Wei, Chiu-Chi
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Volume:
10
Language:
english
Journal:
International Journal of Computer Integrated Manufacturing
DOI:
10.1080/095119297131093
Date:
January, 1997
File:
PDF, 314 KB
english, 1997
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