A new process-variation-immunity method for extracting...

IEEE Electron Device Letters 2002 / 07 Vol. 23; Iss. 7

A new process-variation-immunity method for extracting capacitance coupling coefficients in flash memory cells

Caleb Yu-Sheng Cho,, Ming-Jer Chen,, Jia-Han Lin,, Chiou-Feng Chen,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
23
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2002.1015226
Date:
July, 2002
File:
PDF, 199 KB
english, 2002
Conversion to is in progress
Conversion to is failed