[IEEE 2011 12th International Conference on Ultimate...

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[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - The impact of junction angle on tunnel FETs

Kao, Frank K. H., Verhulst, Anne S., Vandenberghe, William G., Groeseneken, Guido, De Meyer, Kristin
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Year:
2011
Language:
english
DOI:
10.1109/ulis.2011.5757957
File:
PDF, 255 KB
english, 2011
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