Continuous Measurement of Particle Depth in a Microchannel Using Chromatic Aberration
Su, Shin-Yu, Lin, Che-HsinVolume:
31
Language:
english
Journal:
Journal of Lightwave Technology
DOI:
10.1109/JLT.2013.2243818
Date:
April, 2013
File:
PDF, 876 KB
english, 2013