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[IEEE Comput. Soc. Press Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Monterey, CA, USA (27 April-1 May 1997)] Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) - Implicit test pattern generation constrained to cellular automata embedding
Fummi, F., Sciuto, D.Year:
1997
Language:
english
DOI:
10.1109/VTEST.1997.599441
File:
PDF, 659 KB
english, 1997