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[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - Detection of soft X-rays using semi-insulating GaAs detector
Zatko, B., Dubecky, F., Bohacek, P., Necas, V., Ryc, L.Year:
2010
Language:
english
DOI:
10.1109/asdam.2010.5667023
File:
PDF, 388 KB
english, 2010