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[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Statistical leakage modeling in CMOS logic gates considering process variations

D'Agostino, Carmelo, Flatresse, Philippe, Beigne, Edith, Belleville, Marc
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Year:
2008
Language:
english
DOI:
10.1109/icicdt.2008.4567301
File:
PDF, 484 KB
english, 2008
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