[IEEE Tutorial (ICICDT) - Grenoble, France (2008.06.2-2008.06.4)] 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial - Statistical leakage modeling in CMOS logic gates considering process variations
D'Agostino, Carmelo, Flatresse, Philippe, Beigne, Edith, Belleville, MarcYear:
2008
Language:
english
DOI:
10.1109/icicdt.2008.4567301
File:
PDF, 484 KB
english, 2008