Conference report. 6th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF' 96). June 10?11, 1996, Eindhoven, Holland and June 13?14, 1996, Dortmund, Germany
Beaven, PeterVolume:
11
Year:
1996
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/ja996110041n
File:
PDF, 541 KB
english, 1996