[IEEE International Semiconductor Device Research Symposium, 2003 - Washington, DC, USA (Dec. 10-12, 2003)] International Semiconductor Device Research Symposium, 2003 - High temperature hall effect measurements of semi-insulating 4H-SiC substrates
Mitchel, W.C., Mitchell, W.D., Zvanut, M.E.Year:
2003
Language:
english
DOI:
10.1109/isdrs.2003.1272121
File:
PDF, 87 KB
english, 2003