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[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Soft breakdown model of 20 Å gate oxide
Chin-Yuan Ko,, Shiue, R.Y., Yue, J.Year:
2000
Language:
english
DOI:
10.1109/irws.2000.911899
File:
PDF, 213 KB
english, 2000