[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Running scan test on three pins: yes we can!
Moreau, Jocel, Droniou, Thomas, Lebourg, Philippe, Armagnat, PaulYear:
2009
Language:
english
DOI:
10.1109/test.2009.5355693
File:
PDF, 405 KB
english, 2009