[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition...

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[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (2008.10.15-2008.10.17)] 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Current challenges in automating visual perception

Oertel, Carsten, Colder, Brian, Colombe, Jeffrey, High, Julia, Ingram, Michael, Sallee, Phil
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Year:
2008
Language:
english
DOI:
10.1109/aipr.2008.4906457
File:
PDF, 4.23 MB
english, 2008
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