[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Current mirror test structures for studying adjacent layout effects on systematic transistor mismatch
Tuinhout, H.P., Bretveld, A., Peters, W.C.M.Year:
2003
Language:
english
DOI:
10.1109/icmts.2003.1197465
File:
PDF, 461 KB
english, 2003