[IEEE 2008 IEEE International Test Conference - Santa...

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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality

Eichenberger, S., Geuzebroek, J., Hora, C., Kruseman, B., Majhi, A.
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Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700604
File:
PDF, 261 KB
english, 2008
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