![](/img/cover-not-exists.png)
[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Characterization of Low Frequency Noise in Floating Gate NAND Flash Memory
Bae, Sung-Ho, Lee, Jeong-Hyun, Lee, Jong-Ho, Kwon, Hyuck-In, Lee, Seaung-Suk, Om, Jae-Chul, Bae, Gi-HyunYear:
2008
Language:
english
DOI:
10.1109/nvsmw.2008.8
File:
PDF, 1.02 MB
english, 2008