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[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - PPM Reduction on Embedded Memories in System on Chip
Hamdioui, Said, Al-Ars, Zaid, Jimenez, Javier, Calero, JoseYear:
2007
Language:
english
DOI:
10.1109/ets.2007.33
File:
PDF, 184 KB
english, 2007