Simulation of a new back junction approach for reducing...

IEEE Transactions on Nuclear Science 2005 / 12 Vol. 52; Iss. 6

Simulation of a new back junction approach for reducing charge collection in 200 GHz SiGe HBTs

Guofu Niu,, Hua Yang,, Varadharajaperumal, M., Yun Shi,, Cressler, J.D., Krithivasan, R., Marshall, P.W., Reed, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
52
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2005.860744
Date:
December, 2005
File:
PDF, 395 KB
english, 2005
Conversion to is in progress
Conversion to is failed