[IEEE 2011 IEEE International Electron Devices Meeting...

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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - A 192×108 pixel ToF-3D image sensor with single-tap concentric-gate demodulation pixels in 0.13 µm technology

Lee, T.Y., Lee, Y.J., Min, D.K., Lee, S.H., Kim, W.H., Kim, S.H., Jung, J.K., Ovsiannikov, I., Jin, Y.G., Park, Y.D., Fossum, E.R., Chung, C.H.
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Year:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131517
File:
PDF, 820 KB
english, 2011
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