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Infared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films
Webb, J. D., Moutinho, H. R., Kazmerski, L. L., Mueller, C. H., Rivkin, T. V., Treece, R. E., Dalberth, M., Roger, C. T.Volume:
15
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589708015692
Date:
February, 1997
File:
PDF, 617 KB
english, 1997