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[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - Burn-In Stress Test of Analog CMOS ICs
Chin-Long Wey,, Meng-Yao Liu,Year:
2004
Language:
english
DOI:
10.1109/ats.2004.28
File:
PDF, 98 KB
english, 2004