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[IEEE 2012 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Suita, Japan (2012.05.9-2012.05.11)] 2012 IEEE International Meeting for Future of Electron Devices, Kansai - Electrical property of DNA field-effect transistor; Charge retention property
Maeno, Shoko, Takagi, Shyogo, Matsuo, Naoto, Yamana, Kazushige, Heya, Akira, Takada, Tadao, Yokoyama, ShinYear:
2012
Language:
english
DOI:
10.1109/imfedk.2012.6218621
File:
PDF, 248 KB
english, 2012