[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Sensitivity to LET and Test Conditions for SEE Testing of Power MOSFETs
Scheick, Leif, Selva, LuisYear:
2009
Language:
english
DOI:
10.1109/redw.2009.5336308
File:
PDF, 798 KB
english, 2009