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[IEEE 1999 57th Annual Device Research Conference Digest - Santa Barbara, CA, USA (28-30 June 1999)] 1999 57th Annual Device Research Conference Digest (Cat. No.99TH8393) - Source-side barrier effects with very high-K dielectrics in 50 nm Si MOSFETs
Kencke, D.L., Chen, W., Wang, H., Mudanai, S., Ouyang, Q., Tasch, A., Banerjee, S.K.Year:
1999
Language:
english
DOI:
10.1109/drc.1999.806309
File:
PDF, 221 KB
english, 1999