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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - Statistical characterization of complex enclosures with distributed ports
Antonsen, Thomas M., Gradoni, Gabriele, Anlage, Steven, Ott, EdwardYear:
2011
Language:
english
DOI:
10.1109/isemc.2011.6038313
File:
PDF, 588 KB
english, 2011