[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Study on LED degradation using CL, EBIC and a two-diode parameter extraction model
Xiao, H., Liu, Y.Y., Phang, J.C.H., Chan, D.S.H., Chim, W.K., Yan, K.P.Year:
1999
Language:
english
DOI:
10.1109/ipfa.1999.791330
File:
PDF, 353 KB
english, 1999