[IEEE IEEE Lester Eastmann Biennial Conference - Newark,...

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[IEEE IEEE Lester Eastmann Biennial Conference - Newark, DE, USA (6-8 Aug. 2002)] Proceedings. IEEE Lester Eastman Conference on High Performance Devices - Ge incorporation in SiC and the effects on device performance

Roe, K.J., Dashiell, M.W., Xuan, G., Ansorge, E., Katulka, G., Sustersic, N., Zhang, X., Kolodzey, J.
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Year:
2002
Language:
english
DOI:
10.1109/lechpd.2002.1146751
File:
PDF, 348 KB
english, 2002
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