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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Temperature and Voltage Dependent RF Degradation Study in Algan/gan HEMTs
Coffie, R., Chen, Y., Smorchkova, I. P., Heying, B., Gambin, V., Sutton, W., Chou, Y.-C., Luo, W.-B., Wojtowicz, M., Oki, A.Year:
2007
Language:
english
DOI:
10.1109/relphy.2007.369954
File:
PDF, 462 KB
english, 2007