[IEEE Comput. Soc 9th International IEEE On-Line Testing Symposium - Kos Island, Greece (7-9 July 2003)] 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. - Radiation test methodology for SRAM-based FPGAs by using THESIC+
Alderighi, M., Casini, F., D'Angelo, S., Faure, F., Mancini, M., Pastore, S., Sechi, G.R., Velazco, R.Year:
2003
Language:
english
DOI:
10.1109/olt.2003.1214388
File:
PDF, 189 KB
english, 2003