[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure analysis of off-state leakage in high-voltage word-line decoder circuit of memory device
Lai, K. W., Teng, A. S., Tu, C. H., Chang, T. Y., Hsueh, Julia, Lee, M.-Y., Kuo, Albert, Chao, Y. H., Hu, Scott, Tzeng, U. J., Lu, C.-Y.Year:
2014
Language:
english
DOI:
10.1109/ipfa.2014.6898183
File:
PDF, 1.05 MB
english, 2014