[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A practical perspective on reducing ASIC NTFs
Conroy, Z., Richmond, G., Xinli Gu,, Eklow, B.Year:
2005
Language:
english
DOI:
10.1109/test.2005.1583992
File:
PDF, 229 KB
english, 2005