[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - A histogram method for analog-digital converters testing in time and spectral domain
Zagursky, V., Semyonova, N., Sirovatkina, M.Year:
1995
Language:
english
DOI:
10.1109/edtc.1995.470322
File:
PDF, 113 KB
english, 1995