[IEEE 2013 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2013.10.13-2013.10.17)] 2013 IEEE International Integrated Reliability Workshop Final Report - Defect-based compact model for circuit reliability simulation in advanced CMOS technologies
Esqueda, I. S., Barnaby, H. J.Year:
2013
Language:
english
DOI:
10.1109/iirw.2013.6804155
File:
PDF, 620 KB
english, 2013