[IEEE 2012 IEEE 15th International Symposium on Design and...

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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Test and configuration architecture of a sub-THz CMOS detector array

Foldesy, Peter, Gergelyi, Domonkos, Fuzy, Csaba, Karolyi, Gergely
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Year:
2012
Language:
english
DOI:
10.1109/ddecs.2012.6219033
File:
PDF, 795 KB
english, 2012
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