![](/img/cover-not-exists.png)
[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Processing APL properties to generate verification-ready MDG model
Hussain, Kamran, Mohamed, Otmane Ait, Abed, Sa'edYear:
2009
Language:
english
DOI:
10.1109/icm.2009.5418635
File:
PDF, 563 KB
english, 2009