![](/img/cover-not-exists.png)
[IEEE 2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA) - Queenstown, New Zealand (2011.01.17-2011.01.19)] 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application - Scheduling Tests for 3D Stacked Chips under Power Constraints
Sen Gupta, Breeta, Ingelsson, Urban, Larsson, ErikYear:
2011
Language:
english
DOI:
10.1109/delta.2011.23
File:
PDF, 369 KB
english, 2011