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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Statistical Modeling of Leakage Currents Through SiO2/High-κ Dielectrics Stacks for Non-Volatile Memory Applications
Padovani, Andrea, Larcher, Luca, Verma, Sarves, Pavan, Paolo, Majhi, Prashant, Kapur, Pawan, Parat, Krishna, Bersuker, Gennadi, Saraswat, KrishnaYear:
2008
Language:
english
DOI:
10.1109/relphy.2008.4558955
File:
PDF, 258 KB
english, 2008