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[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Thickness Dependence of the Effective Masses in a Strained Thin Silicon Film
Sverdlov, Viktor, Baumgartner, Oskar, Windbacher, Thomas, Schanovsky, Franz, Selberherr, SiegfriedYear:
2009
Language:
english
DOI:
10.1109/sispad.2009.5290252
File:
PDF, 267 KB
english, 2009