Impact of Gate-Induced Strain on MuGFET Reliability

IEEE Electron Device Letters 2008 / 08 Vol. 29; Iss. 8

Impact of Gate-Induced Strain on MuGFET Reliability

Nathanael, Rhesa, Xiong, Weize, Cleavelin, C. Rinn, Liu, Tsu-Jae King
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2008.2000944
Date:
August, 2008
File:
PDF, 592 KB
english, 2008
Conversion to is in progress
Conversion to is failed