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[IEEE 22nd International Reliability Physics Symposium - Las Vegas, NV, USA (1984.04.3-1984.04.5)] 22nd International Reliability Physics Symposium - An Ion Implant Induced Instability Mechanism in CMOS/SOS Device
Spialter, Eila B., Brandewie, Jerry V., Kjar, Raymond A.Year:
1984
Language:
english
DOI:
10.1109/irps.1984.362037
File:
PDF, 4.37 MB
english, 1984