Lot-to-order matching for a semiconductor assembly and test...

IIE Transactions 1999 / 11 Vol. 31; Iss. 11

Lot-to-order matching for a semiconductor assembly and test facility

KNUTSON, KRAIG, KEMPF, KARL, FOWLER, JOHN, CARLYLE, MATT
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Volume:
31
Language:
english
Journal:
IIE Transactions
DOI:
10.1080/07408179908969911
Date:
November, 1999
File:
PDF, 739 KB
english, 1999
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