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[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism
Berg, Ardy van den, Ren, Pengwei, Marinissen, Erik Jan, Gaydadjiev, Georgi, Goossens, KeesYear:
2008
Language:
english
DOI:
10.1109/ets.2008.34
File:
PDF, 412 KB
english, 2008