[IEEE 2010 IEEE International Vacuum Electronics Conference...

  • Main
  • [IEEE 2010 IEEE International Vacuum...

[IEEE 2010 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2010.05.18-2010.05.20)] 2010 IEEE International Vacuum Electronics Conference (IVEC) - P2-2: Tape-helix analysis of conductivity losses in a metal segment loaded helical SWS

Pamisetty, Raja Ramana Rao, Datta, Subrata Kumar, Deshmukh, Vijay A, Kumar, Lalit
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/ivelec.2010.5503522
File:
PDF, 281 KB
english, 2010
Conversion to is in progress
Conversion to is failed