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[IEEE IEEE International Digest on Microwave Symposium - Dallas, TX, USA (8-10 May 1990)] IEEE International Digest on Microwave Symposium - Extraction of microwave noise parameters of FET devices

Colombani, F., Camargo, E.
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Year:
1990
DOI:
10.1109/mwsym.1990.99614
File:
PDF, 238 KB
1990
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