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[IEEE 2010 23rd International Vacuum Nanoelectronics Conference (IVNC) - Palo Alto, CA, USA (2010.07.26-2010.07.30)] International Vacuum Nanoelectronics Conference - 9.4: The effect of ballast resistor and field screening on electron emission of nano-diamond emitters fabricated on micropatterned silicon pillar arrays
Ghosh, Nikkon, Kang, Weng Poo, Raina, Supil, Davidson, JimYear:
2010
Language:
english
DOI:
10.1109/ivnc.2010.5563190
File:
PDF, 333 KB
english, 2010