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[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record - Portland, OR, USA (19-25 Oct. 2003)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - The role of defects on CdTe detector performance
Sellin, P.J., Ozsan, M.E., Hoxley, D., Lohstroh, A., Siffert, P., Sowinska, M., Simon, A.Year:
2004
Language:
english
DOI:
10.1109/nssmic.2003.1352602
File:
PDF, 3.47 MB
english, 2004