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Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties
Byungwhan Kim, Hee Ju Kwon, Seongjin ChoiVolume:
36
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.eswa.2008.07.034
File:
PDF, 234 KB
english, 2009