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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - AAS-Maps: Aging-aware sensitivity-maps for reliability driven analog circuit design
Hellwege, Nico, Heidmann, Nils, Peters-Drolshagen, Dagmar, Paul, SteffenYear:
2014
Language:
english
DOI:
10.1109/irps.2014.6860672
File:
PDF, 295 KB
english, 2014